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Semi-automatic prober Product List and Ranking from 5 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Semi-automatic prober Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. ウイング Tokyo//Electronic Components and Semiconductors
  2. アポロウエーブ　 本社 Osaka//Testing, Analysis and Measurement
  3. 日本マイクロニクス Tokyo//Electronic Components and Semiconductors
  4. 4 ベクターセミコン Tokyo//Electronic Components and Semiconductors
  5. 5 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
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Semi-automatic prober Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober. ウイング
  2. Semi-Automatic Prober AP200/AP300 アポロウエーブ　 本社
  3. Semi-Automatic Prober for Microcurrent Measurement 'AP-80A' 日本マイクロニクス
  4. Semi-Automatic Prober "12-Inch Wafer Semi-Automatic System" ベクターセミコン
  5. 5 Semi-Automatic Prober 'AP-150/AP-200' アポロウエーブ　 本社

Semi-automatic prober Product List

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Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober.

Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober.

12-inch compatible semi-auto prober SA-W300S

Granite base adopted! Semi-auto prober capable of high-precision positioning 【Features】 ○ By using a granite stone plate for the base and equipping a linear shaft motor for the drive motor, it is possible to achieve a backlash of '0'. ○ High-precision positioning is possible, corresponding to the accuracy/resolution of the linear scale. ○ Equipped with a manual loader, making the loading and unloading of wafers easy. ● For other functions and details, please download the catalog.

  • Image Processing Equipment

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Semi-Automatic Prober AP200/AP300

Semi-Automatic Prober AP200/AP300

Semi-automatic prober compatible with microcurrent measurement and high-power measurement! It supports wafer sizes up to 8 and 12 inches, respectively.

-60℃ to +350℃ temperature characteristic evaluation, microcurrent measurement Compatible with power device measurements over 20kV and 200A ◎ A compact shield mechanism that can replace dry air prevents condensation even at negative temperatures. ◎ The compact shielding effect enables stable microcurrent measurements. ◎ The control software is user-friendly and excels in operability for operators. ◎ It can be equipped with automatic wafer alignment and automatic individual chip alignment utilizing image recognition. ◎ The control software is designed with icons arranged in process order to prevent operators from getting lost during operation, enhancing usability. ◎ It has a wafer alignment function that allows for angle adjustment and fine-tuning of XY positions using a model. ◎ After registering the die origin position, it features automatic detection of characteristic patterns through image processing, registering them as reference models. ◎ It is also possible to automatically align registered individual chips placed in a registered tray using image recognition. (Optional) ◎ It can be equipped with auto XYZ to accommodate wafer expansion, etc. (Optional)

  • Other inspection equipment and devices

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Semi-Automatic Prober 'AP-150/AP-200'

Semi-Automatic Prober 'AP-150/AP-200'

Temperature characteristic evaluation from -60℃ to +350℃, suitable for microcurrent measurement! No condensation even at negative temperatures.

The "AP-150/AP-200" is a semi-automatic prober that supports wafer sizes of up to 6 and 8 inches, respectively. Thanks to the effect of the compact shield, stable microcurrent measurements are possible. The compact shield mechanism allows for the replacement of dry air, preventing condensation even at low temperatures. Additionally, it can be equipped with features such as automatic wafer alignment and automatic individual chip alignment utilizing image recognition. 【Features】 ■ Supports power device measurements of over 20kV and 200A ■ Compatible with wafer sizes of up to 6 and 8 inches, respectively ■ Stable microcurrent measurements are possible due to the effect of the compact shield ■ Control software that is easy for operators to understand and excels in usability ■ Can be equipped with automatic wafer alignment and automatic individual chip alignment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Semi-Automatic Prober "12-Inch Wafer Semi-Automatic System"

Semi-Automatic Prober "12-Inch Wafer Semi-Automatic System"

Supports up to 12-inch wafers! Low cost and can be installed in a very small area.

The product is a high-performance semi-automatic prober compatible with up to 12-inch wafers. The "TS3000-SE" is an innovative model that can be introduced at a low cost while supporting various measurements, including 1/f measurements, which were difficult with semi-automatic machines, as well as microcurrent measurements. It can be installed in a very small area, including the chiller unit. 【Features】 ■ "TS3000" - Simultaneous setup of probe card and positioner is possible - Suitable for failure analysis, reliability testing, RF measurements, load pull measurements, etc. - Supports measurements in low-temperature environments while maintaining a wide opening ■ "TS3000-SiPH" - Designed for the characterization of silicon photonics devices - High-precision fiber alignment system with high flexibility - Safe operation is possible *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Semi-Automatic Prober for Microcurrent Measurement 'AP-80A'

Semi-Automatic Prober for Microcurrent Measurement 'AP-80A'

Customization support! Both semi-automatic and manual operations are easy, contributing to improved measurement efficiency.

The "AP-80A" is a semi-automatic prober designed for measuring microcurrents, achieving low noise and high precision through a thorough guard structure. Thanks to its design utilizing guard potential technology, it enables measurement of microcurrents at the fA level. It supports external automatic control and manual operation via a joystick (with six movement modes). Additionally, it can accommodate power devices and can be customized according to usage purposes. 【Features】 ■ Achieves low noise and high precision measurement ■ Simple operation ■ Enables measurement of microcurrents at the fA level through a structure utilizing guard potential technology ■ Supports external automatic control and manual operation via a joystick (with six movement modes) ■ Standard compatibility with systems and software from major measurement instrument manufacturers *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment

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Semi-auto prober (for 8-inch microcurrent measurement)

Semi-auto prober (for 8-inch microcurrent measurement)

High-performance semi-automatic prober capable of measuring microcurrents at the fA level.

■Microcurrent Measurement - Enabled by a structure utilizing guard potential technology, capable of measuring microcurrents at the fA level. - Achieves low noise and high precision measurements. ■Easy Operation - External automatic control and manual operation via joystick (6 movement modes) are possible. * Both semi-automatic and manual operations are easy, contributing to improved measurement efficiency. ■Standard Compatibility with Major Measurement Instrument Manufacturers' Systems and Software - Keysight Technologies (B1500A Semiconductor Device Parameter Analyzer, EasyEXPERT) - Keithley Instruments (Systems and instruments equipped with ACS (measurement software)) * Custom support for other measurement instrument control and software is available. ■Diverse Options and Customization Support - Supports evaluation of temperature-dependent characteristics using a hot chuck (from +40°C to +200°C). - Allows for the installation of microcurrent probe cards using probe card adapters. - Customization is available according to the intended use.

  • Other physicochemical equipment
  • Semiconductor inspection/test equipment

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